It is our great pleasure to announce that the 82nd Annual Meeting of the Japanese Society of Microscopy will be held at the Sendai International Center, Sendai, Japan, from Monday, May 25 to Wednesday, May 27, 2026. We are making every effort to prepare an exciting and fruitful meeting that will provide a platform for presenting and discussing the latest research achievements in microscopy.
The theme of this meeting is “Multiscale, Multimodal Microscopy for Multidisciplinary Research”. In recent years, microscopy technologies have become increasingly diverse and sophisticated, enabling seamless observation across scales from nano to macro and combining different modalities to generate new insights. Furthermore, interdisciplinary research is rapidly expanding, fostering integration across a wide range of fields, including medicine and life sciences, materials science (metals, inorganic, physical, and chemical), and information science. Sendai is at the forefront of this trend: the next-generation synchrotron radiation facility NanoTerasu began operation in 2024, and Tohoku Center of Excellence for Microscopy (TCEM), which integrates microscopy-related facilities at Tohoku University, launched in 2025. We hope this meeting will serve as a venue to share the latest developments in microscopy and to spark new ideas and challenges through interactions among researchers from diverse disciplines. To this end, the program will include sessions not only in the traditional categories of “Instrumentation,” “Materials,” and “Biology,” but also sessions designed from the perspective of “Interdisciplinary Integration” to further strengthen cross-disciplinary collaboration.
The Sendai meeting will also feature a variety of events, including an International Young Researchers Symposium to foster the next generation of scientists, public lectures and hands-on workshops to introduce the fascination of microscopy to junior and senior high school students, and a career support corner.
We sincerely look forward to your participation.
Chair of the 82nd Annual Meeting of The Japanese Society of Microscopy
